The case of AC stress in the hot-carrier effect
- 1 March 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 33 (3) , 424-426
- https://doi.org/10.1109/T-ED.1986.22504
Abstract
During ac hot-carrier stress, the direction of the transient current flow is demonstrated to be important in device degradation as well as the amount of substrate current generated in transient periods.Keywords
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