VI Methods for Determining Optical Parameters of Thin Films
- 1 January 1963
- book chapter
- Published by Elsevier
Abstract
No abstract availableThis publication has 27 references indexed in Scilit:
- Optical Constants and Reflectance and Transmittance of Evaporated Aluminum in the Visible and Ultraviolet*Journal of the Optical Society of America, 1961
- Remarque sur l'influence de la dispersion dans les systèmes de couches minces diélectriquesJournal de Physique et le Radium, 1958
- Optical Properties of Magnesium Fluoride Films in the UltravioletJournal of the Optical Society of America, 1957
- Dielectric Thin Films*Journal of the Optical Society of America, 1957
- Optical Properties of Thin Absorbing Films*Journal of the Optical Society of America, 1957
- Optical Properties of Cadmium Sulfide and Zinc Sulfide from 06 Micron to 14 MicronsJournal of the Optical Society of America, 1955
- Measurement of the Thickness of Thin Films by Multiple-Beam InterferometryProceedings of the Physical Society. Section B, 1951
- Die Bestimmung der optischen Konstanten und der Schichtdicke absorbierender Schichten mit Hilfe der Messung der absoluten PhasenänderungThe European Physical Journal A, 1951
- Recherches sur la propagation des ondes électromagnétiques sinusoïdales dans les milieux stratifiésAnnales de Physique, 1950
- Über die Messung der optischen Konstanten sehr dünner MetallschichtenAnnalen der Physik, 1937