XPS analysis of silane coupling agents and silane‐treated E‐glass fibers
- 1 August 1990
- journal article
- research article
- Published by Wiley in Surface and Interface Analysis
- Vol. 15 (8) , 498-501
- https://doi.org/10.1002/sia.740150809
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
- A comparison of some asymmetrical line shapes for XPS data analysisJournal of Electron Spectroscopy and Related Phenomena, 1989
- A characterization of Kapton polyimide by X-ray photoelectron spectroscopy and energy dispersive spectroscopyJournal of Materials Science, 1988
- Condensation behavior of a sulane coupling agent in the presence of colloidal silica studied by 29Si and 13C NMRJournal of Colloid and Interface Science, 1988
- The Adsorption ofγ-NH2(CH2)3Si(OC2H5)3 on SiO2, Sodium-Silicate, and Sodium-Borosilicate Glass SurfacesPublished by Wiley ,1982
- Interaction of M-50 Steel with a Perfluoroalkylether Fluid and a 1% Additive Fluid FormulationCorrosion, 1980
- The structure of γ-aminopropyltriethoxysilane on glass surfacesJournal of Colloid and Interface Science, 1980
- Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solidsSurface and Interface Analysis, 1979
- Relative photoelectron signal intensities obtained with a magnesium x-ray sourceAnalytical Chemistry, 1975