A comprehensive review of the lognormal failure distribution with application to LED reliability
- 1 January 1978
- journal article
- review article
- Published by Elsevier in Microelectronics Reliability
- Vol. 18 (3) , 267-279
- https://doi.org/10.1016/0026-2714(78)90331-1
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- A diffusion model for GaP red LED degradationJournal of Applied Physics, 1976