Reliability analysis of a repairable parallel system with standby involving human error and common-cause failures
- 1 January 1987
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 27 (2) , 269-271
- https://doi.org/10.1016/0026-2714(87)90180-6
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Stochastic models for evaluating probability of system failure due to human errorMicroelectronics Reliability, 1984