EXCITON LOCALIZATION BY COMPOSITIONAL FLUCTUATIONS IN II-VI SEMICONDUCTOR SOLID SOLUTIONS

1 October 1985

journal article
Published by EDP Sciences in Le Journal de Physique Colloques

Vol. 46 (C7) , C7-173
https://doi.org/10.1051/jphyscol:1985733

Abstract

Localization of excitons by compositional fluctuations has been observed in II-VI solid solutions with substitution in anionic sublattice. The localized exciton states can be probed by selective excitation, polarized emission or time-resolved spectroscopy. The mobility edge for localized exciton system is discussed

Keywords

EXCITON LOCALIZATION
SEMICONDUCTOR SOLID
II VI
VI SEMICONDUCTOR
COMPOSITIONAL FLUCTUATIONS
SOLID SOLUTIONS
LOCALIZATION BY COMPOSITIONAL

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