Infrared characterization of hot spots in solar cells with high precision due to signal treatment processing
- 1 February 1998
- journal article
- Published by Elsevier in Solar Energy Materials and Solar Cells
- Vol. 51 (3-4) , 233-242
- https://doi.org/10.1016/s0927-0248(97)00224-9
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Hot spots and heavily dislocated regions in multicrystalline silicon cellsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Identification of factors reducing Voc in MC silicon solar cellsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1996