Sputter Machining of Piezoelectric Transducers
- 1 October 1969
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 40 (11) , 4357-4361
- https://doi.org/10.1063/1.1657198
Abstract
This paper demonstrates that sputter machining can be used to obtain fundamental mode transducers or resonators for the frequency range above 100 MHz where mechanical methods of thickness reduction have low yields. Material is removed by bombarding the specimen with high-energy ions drawn from a gaseous plasma. Experimental results are given for the sputter machining of sputter-deposited zinc oxide, Y-cut lithium niobate, and Y-cut quartz. The highest fundamental resonant frequency attained was 1.8 GHz using lithium niobate, corresponding to a thickness of about 2 μ.This publication has 5 references indexed in Scilit:
- Crystallographic Orientation of Zinc Oxide Films Deposited by Triode SputteringJournal of Vacuum Science and Technology, 1969
- Performance of bonded, single-crystal LiNbO3and LiGaO2as ultrasonic transducers operating above 100 MhzProceedings of the IEEE, 1968
- Cadmium Sulphide and Zinc Oxide Thin-Film TransducersIEEE Transactions on Sonics and Ultrasonics, 1968
- PHYSICAL LIMITATIONS ON THE PERFORMANCE OF VITREOUS SILICA IN HIGH-FREQUENCY ULTRASONIC AND ACOUSTO-OPTICAL DEVICESApplied Physics Letters, 1967
- Precision polishing of thin single crystal layersJournal of Scientific Instruments, 1967