IVa-2 Determination of surface state capture cross section from transfer loss measurements in CCD's
- 1 September 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 24 (9) , 1206-1207
- https://doi.org/10.1109/t-ed.1977.18950
Abstract
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