Techniques for Memory Testing

• 1 October 1979
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Computer
• Vol. 12  (10) , 23-31
• https://doi.org/10.1109/MC.1979.1658492

Abstract

Keywords

• LIFE TESTING
• PROCESS DESIGN
• LITHOGRAPHY
• SEMICONDUCTOR MEMORY
• FLASH MEMORY
• SEMICONDUCTOR DEVICE TESTING
• PRODUCT DESIGN
• RANDOM ACCESS MEMORY