Techniques to Maximize Software Reliability in Radiation Fields
- 1 January 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 33 (4) , 1100-1102
- https://doi.org/10.1109/TNS.1986.4334544
Abstract
Microprocessor system failures due to memory corruption by single event upsets (SEUs) and/or latch-up in RAM or ROM memory are common in environments where there is high radiation flux. Traditional methods to harden microcomputer systems against SEUs and memory latch-up have usually involved expensive large scale hardware redundancy. Such systems offer higher reliability, but they tend to be more complex and non-standard. At the Space Astronomy Laboratory we have developed general programming techniques for producing software which is resistant to such memory failures. These techniques, which may be applied to standard off-the-shelf hardware, as well as custom designs, include an implementation of our Maximally Redundant Software (MRS) model, error detection algorithms and memory verification and management.Keywords
This publication has 2 references indexed in Scilit:
- The GRAD Gamma Ray SpectrometerIEEE Transactions on Nuclear Science, 1986
- The Grad Data Acquisition and Control SystemIEEE Transactions on Nuclear Science, 1986