Ultramicrohardness measurements of coated samples
- 1 November 1987
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 154 (1) , 199-206
- https://doi.org/10.1016/0040-6090(87)90364-6
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- Ultralow-load hardness tester for use in a scanning electron microscopeReview of Scientific Instruments, 1985