Direct observation of the atomic force microscopy tip using inverse atomic force microscopy imaging
- 1 May 1994
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 12 (3) , 2222-2226
- https://doi.org/10.1116/1.587746
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: