The absolute determination of the reflection integral of Bragg X‐ray analyser crystals. Two‐reflection methods
- 1 July 1977
- journal article
- research article
- Published by Wiley in X-Ray Spectrometry
- Vol. 6 (3) , 132-139
- https://doi.org/10.1002/xrs.1300060306
Abstract
The use of the two‐reflection system for the measurement of the reflection integral of Bragg X‐ray analyser crystals is investigated. Several procedures are developed and shown to produce results consistent with previously reported single reflection measurements. The new procedures are substantially more convenient in routine use.Keywords
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