Auger electron beam effects on electrical properties and surface composition of InP surfaces
- 3 October 1985
- journal article
- Published by Elsevier in Surface Science
- Vol. 162 (1-3) , 186-194
- https://doi.org/10.1016/0039-6028(85)90894-5
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- The Kelvin probe method for work function topographies: technical problems and solutionsVacuum, 1984
- Correlation between the composition profile and electrical conductivity of the thermal and anodic oxides of InSbJournal of Vacuum Science and Technology, 1976