Determination of crystallite size and lattice distortions through X-ray diffraction line profile analysis

This publication has 45 references indexed in Scilit:

• The Use and Accuracy of Continuously Scanning Position-Sensitive Detector Data in X-ray Powder Diffraction
  Published by Springer Nature ,1981
• A New Method for Fast XRPD Using a Position Sensitive Detector
  Published by Springer Nature ,1979
• Special Handling Problems in X-Ray Diffractometry
  Published by Springer Nature ,1979
• International Union of Crystallography Commission on Crystallographic Apparatus. Accuracy of structure factors from X-ray powder intensity measurements
  Acta Crystallographica Section A, 1977
• Utilisation de méthodes d'approximation pour l'étude des coefficients du développement en série de Fourier des raies de diffraction X
  Acta Crystallographica Section A, 1977
• A New Method for Fourier Analysis of Shapes of X-Ray Peaks and Its Application to Line Broadening and Integrated Intensity Measurements
  Published by Springer Nature ,1969
• Conversion of relative intensities to an absolute scale
  Acta Crystallographica Section A, 1969
• Fully Automated High-Precision X-Ray Diffraction
  Published by Springer Nature ,1968
• Analysis of the Broadening of Powder Pattern Peaks from Cold-Worked Face-Centered and Body-Centered Cubic Metals
  Published by Springer Nature ,1964
• The Diffraction of X-Rays by Distorted-Crystal Aggregates III: Remarks on the Interpretation of the Fourier Coefficients
  Proceedings of the Physical Society. Section B, 1952