A depth analysis of cleaved mica surfaces monitored by auger spectroscopy
- 1 January 1973
- journal article
- research article
- Published by Taylor & Francis in Radiation Effects
- Vol. 18 (3-4) , 217-219
- https://doi.org/10.1080/00337577308232125
Abstract
Vacuum cleaved mica surfaces (muscovite) are etched by a 500 eV argon ion beam. The surface composition of the cleaved surface is known from the succession of atomic layers in the crystal. The surface structure and its chemical composition are analysed by LEED and AUGER electron spectroscopy. We show that the bombardment quickly destroys the crystal structure, making an accurate depth analysis of the sample impossible.Keywords
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