A Parallel-Strip Line for Testing RF Susceptibility
- 1 June 1965
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electromagnetic Compatibility
- Vol. 7 (2) , 142-150
- https://doi.org/10.1109/TEMC.1965.4307395
Abstract
This paper presents a technique for establishing known, high intensity RF fields suitable for testing the susceptibility of electronic equipment to these fields. The technique overcomes a deficiency in tests for radiated susceptibility which are required by military specifications, such as MIL-I-26600. Such tests fail to use field intensities that are representative of the environments in which electronic equipment will be installed. It is becoming more important not only to use realistic field strengths, but to know these field strengths to a fair degree of accuracy. The system designer will have more assurance of system compatibility if components have been tested to meet the requirements of the installation environment. A significant amount of time and money can be saved if susceptibility problems are recognized and solved prior to equipment installation.Keywords
This publication has 0 references indexed in Scilit: