Surface-Band Narrowing in Copper from Angle-Resolved X-Ray Photoelectron Spectra
- 12 December 1977
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 39 (24) , 1569-1572
- https://doi.org/10.1103/physrevlett.39.1569
Abstract
X-ray photoelectron spectra from the valence bands of polycrystalline copper have been obtained for various electron emission angles. For grazing angles of emission, the dominant -band peak is found to narrow in width by ∼12% and also to exhibit changes in fine structure. Calculations based upon tight-binding densities of states for various near-surface layers and including electron inelastic attenuation predict all of the observed changes in spectra with angle. No near-surface core binding-energy shift is found.
This publication has 21 references indexed in Scilit:
- Self-Consistent Calculation of Work Function, Charge Densities, and Local Densities of States for Cu(100)Physical Review Letters, 1977
- Angular-dependent XPS valence-band spectra from single-crystal copperSolid State Communications, 1977
- Angle-resolved photoemission from valence bands of Cu and Au single crystals using 32-200-eV synchrotron radiationPhysical Review B, 1976
- Coverage dependent shifts of XPS peaks during chemisorption on metalsSurface Science, 1975
- Electronic surface states in cleaved transition metalsSurface Science, 1975
- Surface densities of states in the tight-binding approximationSurface Science, 1973
- Electronic Density of States at Transition-Metal SurfacesPhysical Review Letters, 1972
- A green's function theory of surface statesSurface Science, 1971
- Orbital Energy Spectra of Electrons in Chemisorption Bonds: O, S, Se on Ni(100)The Journal of Chemical Physics, 1971
- Ion-Neutralization Spectroscopy of Copper and NickelPhysical Review B, 1967