Single crystal x-ray study of SnTaS2 at 295 and 425 K
- 31 August 1990
- journal article
- Published by Elsevier in Materials Research Bulletin
- Vol. 25 (8) , 1011-1018
- https://doi.org/10.1016/0025-5408(90)90008-p
Abstract
No abstract availableKeywords
This publication has 17 references indexed in Scilit:
- Band structure, photoelectron spectroscopy, and transport properties ofPhysical Review B, 1989
- Anharmonic thermal motion of Ag in AgCrSe2: A high-temperature single-crystal X-ray diffraction studyJournal of Solid State Chemistry, 1989
- Electronic structures of intercalation complexes of the layered compound 2H-TaS2Journal of Physics C: Solid State Physics, 1987
- Diffractometer software (CAD4F)Acta Crystallographica Section A Foundations of Crystallography, 1984
- Oxidation state, valency, and electron configuration of tin in a linear sulfur-tin-sulfur arrayInorganic Chemistry, 1980
- The crystal structure of the intercalates SnTaS2 and SnNbS2Materials Research Bulletin, 1977
- Lattice dynamics and hyperfine interactions of intercalation compounds: A single crystal study of TaS2⋅SnThe Journal of Chemical Physics, 1976
- Lattice dynamics and hyperfine interactions of tin in tantalum sulfide layer compoundsThe Journal of Chemical Physics, 1975
- Statistics of derived intensitiesActa Crystallographica Section A, 1975
- X-ray scattering factors computed from numerical Hartree–Fock wave functionsActa Crystallographica Section A, 1968