The Einstein relation

• 1 April 1973
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in Proceedings of the IEEE
• Vol. 61  (4) , 476
• https://doi.org/10.1109/PROC.1973.9070

Abstract

Keywords

• TEMPERATURE
• COPPER
• SEMICONDUCTOR FILMS
• SILICON DEVICES
• ELECTROMIGRATION
• SILICON ALLOYS
• INTEGRATED CIRCUIT METALLIZATION
• ALUMINUM ALLOYS
• DEGRADATION
• INORGANIC MATERIALS