A non-destructive direct carbon-replica method for examination of si surfaces
- 1 August 1964
- journal article
- Published by IOP Publishing in Journal of Scientific Instruments
- Vol. 41 (8) , 523-524
- https://doi.org/10.1088/0950-7671/41/8/121
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- A Comparison of Etching and Fracturing Techniques for Studying Twin Structures in Ge, Si, and III–V Intermetallic CompoundsJournal of the Electrochemical Society, 1960
- Uses of Carbon Replicas in Electron MicroscopyJournal of Applied Physics, 1956