Zone-axis patterns in reflection high-energy electron diffraction: A family of new techniques for surface characterization
- 31 December 1985
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 16 (2) , 175-192
- https://doi.org/10.1016/0304-3991(85)90072-5
Abstract
No abstract availableThis publication has 14 references indexed in Scilit:
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