Theory of amorphous-silicon charge-coupled devices
- 1 March 1984
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 31 (3) , 362-366
- https://doi.org/10.1109/t-ed.1984.21528
Abstract
The theory of operation of amorphous-silicon charge-coupled devices has been studied numerically and analytically under the assumption that the localized states in amorphous-silicon are distributed exponentially with respect to energy. The transfer inefficiency ε is found to depend not only on the localized state density but also on the transit time and initial density of signal electrons. The approximate analysis shows that \ln(\epsilon) is a linear function of logarithmic clock frequency, and that its coefficient is given by the characteristic temperature which represents the steepness of the localized state density distribution in amorphous-silicon.Keywords
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