Infrared spectroscopic characterization of orientation and order of thin oligothiophene films
- 31 January 1998
- journal article
- Published by Elsevier in Optical Materials
- Vol. 9 (1-4) , 65-69
- https://doi.org/10.1016/s0925-3467(97)00133-x
Abstract
No abstract availableKeywords
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