A diffusive creep model for electromigration-induced damage

• 11 September 1981
• journal article
• abstracts
• Published by Elsevier in Thin Solid Films
• Vol. 83  (2) , 208
• https://doi.org/10.1016/0040-6090(81)90668-4

Abstract

Keywords

• CREEP MODEL
• DIFFUSIVE CREEP
• ELECTROMIGRATION INDUCED
• INDUCED DAMAGE