Direct observation of interacting dislocation loops from different sources in Bi2Te3
- 1 November 1966
- journal article
- Published by Elsevier in Physics Letters
- Vol. 23 (7) , 406-408
- https://doi.org/10.1016/0031-9163(66)91064-x
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Three-Dimensional X-Ray Topographic Studies of Internal Dislocation Sources in SiliconJournal of Applied Physics, 1964
- The observation of a dislocation ‘Climb’ sourcePhilosophical Magazine, 1962
- On the formation and properties of helical dislocationsPhilosophical Magazine, 1957
- Copper Precipitation on Dislocations in SiliconJournal of Applied Physics, 1956
- Multiplication Processes for Slow Moving DislocationsPhysical Review B, 1950