The characterization of CrOx/SiO2 catalysts by photoelectron spectroscopy (XPS), X-ray and optical measurements
- 1 December 1976
- journal article
- Published by Elsevier in Journal of Catalysis
- Vol. 45 (3) , 316-325
- https://doi.org/10.1016/0021-9517(76)90355-9
Abstract
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