Idealized statistical models for low-cost linear circuit yield analysis
- 1 February 1977
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems
- Vol. 24 (2) , 62-66
- https://doi.org/10.1109/tcs.1977.1084309
Abstract
For the prediction of manufacturing yield, a modeling technique based on the regionalization of a variable component space is combined with the computational technique of systematic exploration to provide, for linear circuits, a remarkably efficient prediction of the spread in circuit performance due to spread in a number of components. Illustrative examples enable the new approach to be compared with the Monte Carlo technique.Keywords
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