Automatic selection of optimal probing points for e-beam measurements
- 31 March 1992
- journal article
- Published by Elsevier in Microelectronic Engineering
- Vol. 16 (1-4) , 111-120
- https://doi.org/10.1016/0167-9317(92)90331-k
Abstract
No abstract availableThis publication has 1 reference indexed in Scilit:
- Corner Stitching: A Data-Structuring Technique for VLSI Layout ToolsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1984