Low-stress, coolable sample mount for ultrahigh vacuum studies of fragile semiconductors
- 1 January 1992
- journal article
- conference paper
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 63 (1) , 218-219
- https://doi.org/10.1063/1.1142960
Abstract
A sample mount is described that is particularly useful for cooling and uniformly heating thin, fragile semiconductor samples in ultrahigh vacuum while maintaining optical flatness. The design is based on spring-loaded clips and permits rapid sample exchange. Difficulties with certain conventional methods of temperature measurement are avoided.Keywords
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