Determination of In0.53Ga0.47As layer thicknesses from ethched steps
- 1 April 1984
- journal article
- Published by Springer Nature in Journal of Materials Science Letters
- Vol. 3 (4) , 340
- https://doi.org/10.1007/bf00729391
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- A Slow Selective Etch for GaInAsP Grown on InPJournal of the Electrochemical Society, 1983