Preparation of SiO2-pillared layered titanate thin films
- 1 December 2000
- journal article
- Published by Springer Nature in Journal of Materials Research
- Vol. 15 (12) , 2587-2590
- https://doi.org/10.1557/jmr.2000.0369
Abstract
The interlayer space of a thin film of layered titanate, Cs0.68Ti1.830.17O4, was successfully expanded by SiO2 pillaring. Ion exchange of the Cs ions in the interlayer to alkylammoniuim cations, n-CnH2n+1NH3+ (n = 8, 12, 18), expanded the interlayer space, and enabled intercalation of tetraethylorthosilicate. X-ray diffraction and the cross section of transmission electron microscopy images revealed that tetraethylorthosilicate-treated thin film maintained the expansion of interlayer space by SiO2 pillaring after calcination at 773 K. X-ray photoelectron spectroscopy after etching the thin film about 100 nm from the surface further confirmed the existence of SiO2 in the interlayer space.Keywords
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