Design and implementation of a Kelvin microprobe for contact potential measurements at the submicron scale
Open Access
- 1 January 1994
- journal article
- Published by EDP Sciences in Microscopy Microanalysis Microstructures
- Vol. 5 (4-6) , 509-517
- https://doi.org/10.1051/mmm:0199400504-6050900
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Kelvin probe force microscopyApplied Physics Letters, 1991
- Noise and the Kelvin methodReview of Scientific Instruments, 1991
- Analysis of stray capacitance in the Kelvin methodReview of Scientific Instruments, 1991
- Application of a Kelvin Microprobe to the Corrosion of Metals in Humid AtmospheresJournal of the Electrochemical Society, 1991
- Micro Kelvin probe for local work-function measurementsReview of Scientific Instruments, 1988
- Conditions necessary to get meaningful measurements from the Kelvin methodJournal of Physics E: Scientific Instruments, 1982
- A critique of the Kelvin method of measuring work functionsJournal of Physics E: Scientific Instruments, 1970
- A NEW METHOD OF MEASURING CONTACT POTENTIAL DIFFERENCES IN METALSReview of Scientific Instruments, 1932
- V. Contact electricity of metalsJournal of Computers in Education, 1898