High-Resolution Electron Microscopy of Twist and General Grain Boundaries
- 19 July 1999
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 83 (3) , 556-559
- https://doi.org/10.1103/physrevlett.83.556
Abstract
High-resolution imaging of atomic structures of twist and general grain boundaries (GBs) is reported in samples prepared by a thin-film technique in which [011] and [001] oriented Au grains are epitaxially grown side by side, allowing the investigation of a wide range of GB geometries. GBs with tilt as well as twist components typically have structural modulations along the interface and often show a surprising amount of coherence between lattice planes crossing the interface. The [110], 90° symmetric twist GB does not remain planar, but reconstructs into atomic-scale microfacets.Keywords
This publication has 9 references indexed in Scilit:
- The realization of atomic resolution with the electron microscopeReports on Progress in Physics, 1997
- High-resolution electron microscopy of grain boundariesInterface Science, 1995
- Atomic structure of grain boundariesJournal of Physics and Chemistry of Solids, 1994
- The atomic structure of a [100], 45° twist plus 17.5° tilt grain boundary in aluminium by high-resolution electron microscopyPhilosophical Magazine A, 1991
- A broken-bond model for grain boundaries in face-centered cubic metalsJournal of Applied Physics, 1990
- Structure-energy correlation for grain boundaries in f.c.c. metals—II. Boundaries on the (110) and (113) planesActa Metallurgica, 1989
- Structures of [001] twist boundaries in gold. II. Results obtained by x-ray diffraction and computer simulationPhysical Review B, 1989
- Quantitative X-ray diffraction study of the atomic structure of the ∑ = 5(θ = 36.9°) [001]twist boundary in goldActa Metallurgica, 1988
- HIGH RESOLUTION ELECTRON MICROSCOPY OF GRAIN BOUNDARIES IN fcc AND bcc METALSLe Journal de Physique Colloques, 1985