Low energy electron microscopy of surfaces
- 31 July 1988
- journal article
- Published by Elsevier in Surface Science
- Vol. 200 (2-3) , 512-513
- https://doi.org/10.1016/0039-6028(88)90557-2
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Surface imaging with LEEMApplied Physics A, 1987
- Kinetics of the (7 × 7) ↔ (1 × 1) Transition on Si(111)Berichte der Bunsengesellschaft für physikalische Chemie, 1986
- The resolution of the low energy electron reflection microscopeUltramicroscopy, 1985
- An analytical reflection and emission UHV surface electron microscopeUltramicroscopy, 1985
- Direct observation of the phase transition between the (7 × 7) and (1 × 1) structures of clean (111) silicon surfacesSurface Science, 1981