Method for measuring the field from a magnetic recording head in the scanning electron microscope
- 1 April 1983
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 130 (1) , RP1-RP2
- https://doi.org/10.1111/j.1365-2818.1983.tb04192.x
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Schlieren method as applied to magnetic recording heads in the scanning electron microscopeApplied Physics Letters, 1983
- Scanning electron microscopy of two‐dimensional magnetic stray fieldsScanning, 1980
- The generation and identification of SEM channelling patterns from 10 μm selected areasJournal of Materials Science, 1971
- MAGNETIC FIELD MEASUREMENTS IN THE SCANNING ELECTRON MICROSCOPEApplied Physics Letters, 1968