Dependence of the magnetic properties of Co/Pd multilayered films on the structural parameters estimated accurately by x-ray diffraction

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Abstract
In this study, Co/Pd multilayered films with a few atomic layers of Co were prepared by alternating deposition in an ultrahigh‐vacuum physical‐vapor‐deposition system. The structural parameters were estimated accurately making use of only the angular positions of x‐ray diffraction peaks. The magnetic properties were found to vary greatly depending on Pd predeposition and Pd‐sublayer thicknesses as well as Co‐sublayer thickness. The Pd‐predeposited films were found to have a remarkably high coercivity of 4723 Oe and a greatly enhanced interfacial magnetic anisotropy of 0.72 mJ/m2, which indicates an excellent potential as a magneto‐optical recording medium.