The interpretation of electron microscope images and scattering patterns from crazes
- 30 April 1985
- Vol. 26 (4) , 483-489
- https://doi.org/10.1016/0032-3861(85)90146-6
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- The use of small-angle electron scattering to compare the structure of craze found in thin films with that found in bulk materialsJournal of Polymer Science: Polymer Physics Edition, 1983
- A simple technique for the measurement of inner potentials with particular application to polymeric materialsUltramicroscopy, 1982
- Defocus electron microscopy of multiphase polymers: use and misusePolymer, 1981
- The effect of film thicknesses on craze microstructureJournal of Materials Science, 1981
- Critical evaluation of electron microscope evidence for order in glassy polymersPolymer, 1979
- Microscopic mechanisms and mechanics of craze growth and fracturePhilosophical Magazine A, 1979
- Measurement of craze density by quantitative transmission electron microscopyJournal of Materials Science, 1979