Dependence of X-ray yields on different parameters for light element matrices in thick target PIXE and use of standards for calibration in such analysis
- 1 November 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 216 (3) , 481-488
- https://doi.org/10.1016/0167-5087(83)90516-1
Abstract
No abstract availableKeywords
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