Determination of the Surface Recombination Velocity and of Its Evolution in Monocrystalline Silicon by the Light Beam Induced Current Technique in Planar Configuration
- 1 December 1998
- journal article
- Published by Trans Tech Publications, Ltd. in Solid State Phenomena
- Vol. 63-64, 123-130
- https://doi.org/10.4028/www.scientific.net/ssp.63-64.123
Abstract
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