High-resolution dark-field electron microscopy. I. Useful approximations

• 1 September 1973
• journal article
• Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A
• Vol. 29  (5) , 529-536
• https://doi.org/10.1107/s0567739473001324

Abstract

Keywords

• SIMPLE EXPRESSIONS
• DARK FIELD
• RESOLUTION DARK
• INTENSITY DISTRIBUTIONS
• THIN SPECIMENS
• ELECTRON MICROGRAPHS
• BEAM
• COMPLICATIONS
• FIELD ELECTRON