Electrical Properties of Thin Polymer Films. Part II. Thickness 50–150 Å
- 1 July 1964
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 35 (7) , 2179-2184
- https://doi.org/10.1063/1.1702813
Abstract
The current I through silicone polymer films formed by electron‐beam bombardment in the thickness range 50–150 Å has been measured as a function of voltage V and temperature between 77° and 300°K. The electrodes were evaporated silver films. The behavior is Ohmic at low voltage, and log I varies as V ½ at higher voltages up to about 1 V. The voltage dependence is insensitive to temperature, although the total current depends rather strongly on temperature. The current decreases with time, as a result of the diffusion of oxygen into the dielectric film. Changes in the current are closely correlated with capacity changes. Simple tunneling theory, including the effects of image force and dielectric constant, fails to account for all the data.This publication has 17 references indexed in Scilit:
- Electric Tunnel Effect between Dissimilar Electrodes Separated by a Thin Insulating FilmJournal of Applied Physics, 1963
- Tunneling into Superconductors at Temperatures below 1°KPhysical Review B, 1962
- Schottky Emission Through Thin Insulating FilmsPhysical Review Letters, 1962
- A Study of Superconducting Niobium by Electron TunnellingProceedings of the Physical Society, 1961
- Use of Monomolecular Layers in Evaporated-Film Tunneling DevicesJournal of Applied Physics, 1961
- Study of Superconductors by Electron TunnelingPhysical Review B, 1961
- Mechanisms of space-charge-limited current in solidsSolid-State Electronics, 1961
- On Pre-Breakdown Phenomena in Insulators and Electronic Semi-ConductorsPhysical Review B, 1938
- Einige Kontaktwiderstandsmessungen bei tiefen TemperaturenThe European Physical Journal A, 1933
- Messungen mit Hilfe von flüssigem Helium. XIIIThe European Physical Journal A, 1932