Controlled Dephasing of Electronsviaa Phase Sensitive Detector

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Abstract
We demonstrate a controlled dephasing experiment via exploiting a unique entangled interferometer-detector system, realized in an electronic mesoscopic structure. We study the dephasing process both from the which path information available in the detector and, alternatively, from the direct effect of the detector on the interferometer. Detection is possible only due to an induced phase change in the detector. Even though this phase change cannot actually be measured, strong dephasing of the interferometer took place. The intricate role of detector's noise and coherency are investigated.
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