The use of the signal current pulse shape to study the internal electric field profile and trapping effects in neutron damaged silicon detectors
- 1 March 1993
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 326 (1-2) , 350-356
- https://doi.org/10.1016/0168-9002(93)90376-s
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
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- Low-Noise Techniques in DetectorsAnnual Review of Nuclear and Particle Science, 1988
- Drift velocity of electrons and holes and associated anisotropic effects in siliconJournal of Physics and Chemistry of Solids, 1971
- Preparation of Stable Counters by Means of Compensating Germanium with Radiation Produced Structural DefectsIEEE Transactions on Nuclear Science, 1968