Optimum fault isolation by statistical inference
- 1 July 1979
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Circuits and Systems
- Vol. 26 (7) , 505-512
- https://doi.org/10.1109/tcs.1979.1084667
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Voting Techniques for Fault Diagnosis from Frequency-Domain Test-DataIEEE Transactions on Reliability, 1975
- Fault isolation with insufficient measurementsIEEE Transactions on Circuit Theory, 1973
- Statistical Considerations in Element Value SolutionsIRE Transactions on Military Electronics, 1962