Scanning probe microscopy of organic and polymeric films: from self-assembled monolayers to composite multilayers
- 1 April 1995
- Vol. 36 (9) , 1791-1808
- https://doi.org/10.1016/0032-3861(95)90925-r
Abstract
No abstract availableKeywords
This publication has 115 references indexed in Scilit:
- Atomic Force Microscopy of C60 Tethered to a Self-Assembled MonolayerLangmuir, 1994
- In-plane anisotropy and phase change in Langmuir-Blodgett films of disklike moleculesLangmuir, 1993
- Wetting properties of thin liquid polyethylene propylene filmsPhysical Review Letters, 1993
- Commensurate defect superstructures in a Langmuir-Blodgett filmPhysical Review Letters, 1993
- Experimental study of the surface structure of diblock copolymer films using microscopy and x-ray scatteringThe Journal of Chemical Physics, 1993
- Monte Carlo simulation of the mechanical relaxation of a self-assembled monolayerPhysical Review Letters, 1993
- Atomic-force-microscope study of polymer lubricants on silicon surfacesPhysical Review Letters, 1992
- Mechanical relaxation of organic monolayer films measured by force microscopyPhysical Review Letters, 1992
- Thermal and transport properties of copoly(γ‐stearyl L‐glutamate‐γ‐methyl L‐glutamate)Journal of Polymer Science Part A: Polymer Chemistry, 1990
- The effects of substrate roughness on ultrathin water filmsThe Journal of Chemical Physics, 1989