Characterization of native dislocations in chalcopyrite AgGaS 2 by X-ray topography
- 1 October 1996
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 167 (3-4) , 616-620
- https://doi.org/10.1016/0022-0248(96)00269-2
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- The crystal structure refinement of chalcopyrite, CuFeS2Acta Crystallographica Section B: Structural Science, Crystal Engineering and Materials, 1973