Out-of-control pattern recognition and analysis for quality control charts using LISP-based systems
Open Access
- 31 January 1995
- journal article
- Published by Elsevier in Computers & Industrial Engineering
- Vol. 28 (1) , 81-91
- https://doi.org/10.1016/0360-8352(94)00028-l
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- A framework for Expert System development in statistical quality controlComputers & Industrial Engineering, 1988
- The application of expert systems to manufacturing process controlComputers & Industrial Engineering, 1987