Determination of implanted electrical profiles by a microwave contactless method: Application to selenium implantation in semi-insulating InP
- 15 May 1983
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research
- Vol. 209-210, 629-635
- https://doi.org/10.1016/0167-5087(83)90859-1
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Caractérisation électrique de couches minces conductrices par une méthode hyperfréquence sans contactRevue de Physique Appliquée, 1982
- Electric and magnetic properties of linear conducting chainsPhysica Status Solidi (a), 1972
- Microwave ElectronicsReviews of Modern Physics, 1946
- Demagnetizing Factors of the General EllipsoidPhysical Review B, 1945